HOME > Presentation > DetailCharacterization of hole gas accumulation in p-Si/i-Ge core-shell and p-Si/i-Ge/p-Si core-double shell nanowires張 小龍, ジェバスワン ウイパコーン, 深田 直樹. The 79th JSAP Autumn Meeting, 2018. 2018.NIMS author(s)JEVASUWAN, WipakornFUKATA, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2018-07-15 16:49:23 +0900Updated at: 2018-07-15 16:49:23 +0900