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CドープIn-Si-O薄膜トランジスタの負バイアス不安定性
(Negative bias stress instability in C-doped In-Si-O thin film transistors)
ULSIC vs TFT 2017. May 21, 2017-May 25, 2017.
NIMS author(s)
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Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2017-04-18 22:54:59 +0900 Updated at: 2018-06-05 14:07:14 +0900