HOME > Published patent applications > Detail[Published patent application] イオンの測定装置及びそれを用いた点欠陥の位置検出方法2019-08-29. 2019145255 (Google Patents) , 7016096NIMS author(s)TOSA, MasahiroMIYAUCHI, NaoyaITAKURA, AkikoCreated at :2023-07-22 21:45:59 +0900 Updated at :2023-07-22 21:45:59 +0900
