HOME > Published patent applications > Detail
[Published patent application] テラヘルツ磁気光学センサ、これを用いた高性能非破壊検査装置及び方法、並びにこれに用いる磁気光学撮像センサ
NIMS author(s)
Created at :2023-07-22 21:46:07 +0900 Updated at :2023-07-22 21:46:07 +0900
HOME > Published patent applications > Detail
