HOME > Published patent applications > Detail[Published patent application] 局所ポテンシャル障壁高さのパラメータ依存性測定方法2004-09-02. 2004245698 (Google Patents) , 3834642NIMS author(s)YAGYU, ShinjiroYOSHITAKE, MichikoCreated at :2023-07-22 21:44:52 +0900 Updated at :2023-07-22 21:44:52 +0900
