HOME > Misc > Detail Electron Channeling Contrast Imaging: A Powerful Technique to Quantitative Microstructure Characterization in the SEMIvan Gutierrez-Urrutia. Microscopy 64 [suppl 1] i32.1-i32. 2015.https://doi.org/10.1093/jmicro/dfv114 NIMS author(s)GUTIERREZ URRUTIA, IvanFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2020-11-20 10:41:34 +0900Updated at: 2024-04-01 21:18:49 +0900