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Characterization of zinc oxide single crystal for epitaxial wafer applications
(酸化亜鉛ウエファーのエピタキシャル基板としての評価)

OHASHI, Naoki, OGAKI, Takeshi, SUGIMURA, Shigeaki, MAEDA, Katsumi, SAKAGUCHI, Isao, RYOKEN, Haruki, 新倉郁生, 佐藤充, HANEDA, Hajime.
Proceeding of Materials Reserch Society . 2004.

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

    Created at: 2022-09-05 11:27:18 +0900Updated at: 2022-09-05 11:27:18 +0900

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