走査型トンネル顕微鏡を用いた単一半導体ナノ構造の物性研究
(Study of optical and electronic properties of individual semiconductor nanostructures using scanning tunneling microscope)
| Author(s) | TSURUOKA, Tohru. |
|---|---|
| Journal title | Japan Nanonet Bulletin [70] 2-2 |
| Publisher | |
| Year of publication | 2004 |
| Language | Japanese |