走査型トンネル顕微鏡を用いた単一半導体ナノ構造の物性研究
(Study of optical and electronic properties of individual semiconductor nanostructures using scanning tunneling microscope)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2020-11-20 10:41:04 +0900Updated at: 2020-11-20 10:41:04 +0900