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走査型トンネル顕微鏡を用いた単一半導体ナノ構造の物性研究
(Study of optical and electronic properties of individual semiconductor nanostructures using scanning tunneling microscope)

Author(s)TSURUOKA, Tohru.
Journal titleJapan Nanonet Bulletin [70] 2-2
Publisher
Year of publication2004
LanguageJapanese

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