直線偏光制御を用いた硬X 線光電子分光による極性GaN 結晶の電子状態研究
(Investigation of crystalline-polarity-dependent electronic structures of GaN by hard X-ray photoemission spectroscopy)
NIMS author(s)
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Created at: 2020-11-20 10:37:43 +0900Updated at: 2020-11-20 10:37:43 +0900