その場SXSおよびXAFS法の電気化学界面への応用
(In situ SXS and XAFS measurements of electrochemical interface)
| Author(s) | KONDO, Toshihiro, MASUDA, Takuya, UOSAKI, Kohei. |
|---|---|
| Journal title | Vol. 5: X-ray and Neutron Techniques for Nanomaterials Characterization, 5th volume of SPRINGER book series on "Characteriz 367-449 |
| Publisher | |
| Year of publication | 2016 |
| Language | Japanese |