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Force Spectroscopy on Semiconductor Surfaces
(Force spectroscopy on semiconductor surfaces)

Oscar Custance, Noriaki Oyabu, Yoshiaki Sugimoto.
Noncontact Atomic Force Microscopy Volume 2 31-68. 2009.
https://doi.org/10.1007/978-3-642-01495-6_3

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    Fulltext and dataset(s) on Materials Data Repository (MDR)

      Created at: 2017-01-08 03:48:11 +0900 Updated at: 2025-05-21 05:49:52 +0900

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