SAMURAI - NIMS Researchers Database

HOME > Book > Detail

Showing Book

AuthorSEKIGUCHI, Takashi, CHEN, Jun.
TitleDefect Characterization in Silicon by Electron-Beam-Induced Current and Cathodoluminescence Techniques
(Defect Characterization in Silicon by Electron-Beam-Induced Current and Cathodoluminescence Techniques) Defects and Impurities in Silicon Materials: An Introduction to Atomic-Level Silicon Engineering
Publisher name
Year of publication2016
LanguageEnglish

▲ Go to the top of this page