| 104件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| Weijie Song, Michiko Yoshitake, Thi Thi Lay. X-ray photoelectron spectroscopic analysisi of growth and thermal stability of palladium ultra thin films on alumina/NiAl(110). Surface and Interface Analysis. 36 [8] (2004) 1136-1139 10.1002/sia.1859 | |
| Michiko Yoshitake, Shinjiro Yagyu. The effect of bias voltage on the measurement of local barrier height. Surface and Interface Analysis. 36 [8] (2004) 1106-1109 10.1002/sia.1851 | |
| Michiko Yoshitake, Yasuhiro Yamauchi, Chandra Bose. Sputtering rate measurements of some transition metal silicides and comparison with those of the elements. Surface and Interface Analysis. 36 [8] (2004) 801-804 10.1002/sia.1768 | |
| T. Oishi, M. Goto, A. Kasahara, M. Tosa. Low frictional copper oxide film prepared with sodium hydroxide solution. Surface and Interface Analysis. 36 [8] (2004) 1259-1261 10.1002/sia.1889 | |
| TANUMA, Shigeo. Calculations of electron inelastic mean free paths (IMFPs) VII. Reliability of the TPP-2M predictice equation. SURFACE AND INTERFACE ANALYSIS. (2003) 268-275 | |
| M. Yoshitake, S. Bera, Y. Yamauchi. AES and LEED study of well-ordered oxide film grown on Cu-9at%Al(111). Surface and Interface Analysis. 35 [10] (2003) 824-828 10.1002/sia.1610 | |
| K. Asami, K. Saito, N. Ohtsu, S. Nagata, T. Hanawa. Titanium-implanted CaTiO3 films and their changes in Hanks solution. Surface and Interface Analysis. 35 [5] (2003) 483-488 10.1002/sia.1554 | |
| K. Miyazawa, Y. Kuwasaki, K. Hamamoto, S. Nagata, A. Obayashi, M. Kuwabara, MIYAZAWA, Kunichi, 桑崎悠介, 濱本孝一, 長田悟, 大林昭雄, 桑原誠. Structural characterization of C60 nanowhiskers formed by the liquid/liquid interfacial precipitation method. Surface and Interface Analysis. 35 [1] (2003) 117-120 | |
| K. Miyazawa, Y. Kuwasaki, K. Hamamoto, S. Nagata, A. Obayashi, M. Kuwabara. Structural characterization of the C60 nanowhiskers formed by the liquid-liquid interfacial precipitation method. Surface and Interface Analysis. 35 [1] (2003) 117-120 10.1002/sia.1506 | |
| M. Yoshitake, A. Thananan, T. Aizawaki, K. Yoshihara. micro-XPS analysis of TiN with/without Cl implantation. Surface and Interface Analysis. 34 [1] (2002) 698-702 10.1002/sia.1391 | |
