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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2025年06月24日

85件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • TAKEMURA, Kenichi, P. Ch. Sahu, Kunii Yoshiyasu, Toma Yasuo, Takemura Kenichi, P. Ch. Sahu, Kunii Yoshiyasu, Toma Yasuo. A versatile gas-loading system for diamond-anvil cells. Review of Scientific Instruments. 72 [10] (2001) 3873-3876 10.1063/1.1396667
  • V. Bondarenko, UJI, Shinya, Tanatar M. A., Kovalev A. E., Ishiuro T., 鹿児島誠一. Miniature rotatable vacuum cell for low temperature thermal measurements in high magnetic fields. Review of scientific instruments. (2000)
  • N Fortune, Gossett G, Peabody L, Lehe K, S. Uji, Nathanael Fortune, Gayle Gossett, Lydia Peabody, Katherine Lehe, H. Aoki. High magnetic field corrections to resistance thermometers for low temperature calorimetry. Review of Scientific Instruments. 71 [10] (2000) 3825 10.1063/1.1310341
  • Hideki T. Miyazaki, 新谷紀雄, Yasushi Tomizawa, Koichi Koyama, Tomomasa Sato, Yasushi Tomizawa, Koichi Koyano, Tomomasa Sato, Norio Shinya. A system for measuring the adhesion forces of micro-objects in a scanning electron microscope. Review of Scientific Instruments. 71 [8] (2000) 3123-3131 10.1063/1.1305812
  • 鈴木良尚, 沢田勉, 宮下哲, 小松哲. In situ measurements of the solubility of crystals under high pressure by an interferometric method. Review of Scientific Instruments. (1998)
  • UCHIHASHI, Takashi, NEJO, Hitoshi, 永田正明. Combined Liquid-Metal-Ion-Source and Scanning Tunneling Microscope with Electrical Measurement Probes for Operation at Cryogenic. Review of Scientific Instrumentation(Rev.Sci.Instrum). (1996)
  • 原田雅章, 桜井健次, 桜井健次, Masaaki Harada, Kenji Sakurai. Narrow Pulse Shaping for High-counting-rate X-ray Measurement. Review of Scientific Instruments. 67 [2] (1996) 615-616 10.1063/1.1146618
  • SHIMOMURA, Shuichi, 中沢弘基. Annular-type solid state detector for a scanning x-ray analytical microscope. Review of Scientific Instruments. (1995)
  • 桜井健次, 桜井仁, Kenji Sakurai, Hitoshi Sakurai. Commento on "High intensity low tube-voltage X-ray source for laboratory Extended X-ray Absorption Fine Structure measurements" . Review of Scientific Instruments. 65 [7] (1994) 2417-2418 10.1063/1.1144701
  • 桜井健次, 桜井仁, Kenji Sakurai. High-Intensity Low-Tube-Voltage X-ray Source for Laboratory EXAFS Measurements.. Review of Scientific Instruments. 64 [1] (1993) 267-268 10.1063/1.1144396
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