| 104件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| JIN, Hua, YOSHIKAWA, Hideki, TANUMA, Shigeo, Sven Tougaard. Energy loss function for Si determined from reflection electron energy loss spectra with factor analysis method. SURFACE AND INTERFACE ANALYSIS. (2010) 1076-1081 | |
| Dahlang Tahir, Eun Hye Choi, Young Joon Cho, Suhk Kun Oh, Hee Jae Kang, Hua Jin, Sung Heo, Jae Gwan Chung, Jae Cheol Lee, Sven Tougaard. Electronic and optical properties of La-aluminate dielectric thin films on Si (100). Surface and Interface Analysis. 42 [10-11] (2010) 1566-1569 10.1002/sia.3590 | |
| T. Nagatomi, S. Tanuma, K. Goto. Absolutely determined inelastic mean free paths for 300–3000 eV electrons in 10 elemental solids. Surface and Interface Analysis. 42 [10-11] (2010) 1537-1540 10.1002/sia.3570 | |
| Miyoko Tanaka, Atsushi Teraoka, Masayuki Shimojo. Magic Cluster Arrays of In and In/Ag Compound on Si(111)-7×7 studied by UHV-TEM / STM. Surface and Interface Analysis. 42 [10-11] (2010) 1520-1523 10.1002/sia.3579 | |
| Slavomir Nemsak, Tomas Skala, Michiko Yoshitake, Nataliya Tsud, Taeyoung Kim, Shinjiro Yagyu, Vladimir Matolin. Growth of thin epitaxial alumina films onto Ni(111): an electron spectroscopy and diffraction study. Surface and Interface Analysis. 42 [10-11] (2010) 1581-1584 10.1002/sia.3582 | |
| Taeyoung Kim, Michiko Yoshitake, Shinjiro Yagyu, Slavomir Nemsak, Takahiro Nagata, Toyohiro Chikyow. XPS study on band alignment at PtO-terminated ZnO(0001) interface. Surface and Interface Analysis. 42 [10-11] (2010) 1528-1531 10.1002/sia.3601 | |
| Mitsuhiro Okuda, Masaki Takeguchi, Yufang Zhu, Ayako Hashimoto, Nobuhiro Ogawa, Motohiro Tagaya, Song Chen, Nobutaka Hanagata, Toshiyuki Ikoma. Structural analysis of rattle-type hollow mesoporous silica spheres using electron tomography and energy filtered imaging. Surface and Interface Analysis. 42 [10-11] (2010) 1548-1551 10.1002/sia.3572 | |
| M. Yoshitake, K. Ohmori, T. Chikyow. Interface characterization of a metal-oxide-semiconductor structure by biased X-ray photoelectron spectroscopy. Surface and Interface Analysis. 42 [2] (2010) 70-76 10.1002/sia.3154 | |
| KIMURA Kenji, NAKAJIMA Kaoru, ZHAO Ming, NOHIRA Hiroshi, HATTORI Takeo, KOBATA Masaaki, IKENAGA Eiji, KIM Jun Jin, KOBAYASHI, Keisuke, CORNARD Thierry, VANDERVORST Wilfried. Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states. SURFACE AND INTERFACE ANALYSIS. (2008) 423-426 | |
| Akai-Kasaya Megumi, Higuchi Yuichi, Yura Kayo, Yoshida Akihito, Saito Akira, AONO, Masakazu, Kuwahara Yuji. Polymerization-direction-controlled growth of polydiacetylene on artificial silicon oxide templates. SURFACE AND INTERFACE ANALYSIS. (2008) 1037-1041 | |
