SAMURAI - NIMS Researchers Database

HOME > 研究者を検索 > 論文・分野から探す

論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2026年01月23日

68件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • K. Kimoto. Spatially-resolved EELS analysis of multilayer using EFTEM and STEM. Journal of Electron Microscopy. 50 [6] (2001) 523-528 10.1093/jmicro/50.6.523
  • MITSUISHI, Kazutaka, TAKEGUCHI, Masaki, 保田英洋, FURUYA, Kazuo. New Scheme of Calculation of Annular Dark-Field STEM Image Including Both Elastically Diffracted and TDS Waves. JOURNAL OF ELECTRON MICROSCOPY. 50 [3] (2001) 157-162
  • ABE, Eiji, TAKAKURA, Hiroyuki, TSAI, Anpang. Ho arrangement in the Zn6Mg3Ho icosahedral quasicrystal studied by atomic-resolution Z-contrast STEM. Journal of Electron Microscopy (special issue on STEM). (2000)
  • 竹口雅樹, 古屋一夫, 吉原一紘. Siナノ粒子の新しい創製技術と粒子表面の原子分解能観察への応用. Journal of Electron Microscopy. (1999)
  • Marco Cantoni, 内田正哉, 松井良夫, TAKEKAWA, Shunji, 鶴田忠正, 堀内繁雄. Observation of the interaction of vortices with dislocations in a Nb superconductor by a cryo-Lorentz EM. Journal of Electron Microscopy. (1998)
  • DmitriGolberg, BANDO, Yoshio, M.Eremets, KURASHIMA, Keiji, 多見谷隆, TAKEMURA, Kenichi, YUSA, Hitoshi. High-resolution analytical electron microscopy of boron nitride laser heated at high pressure. Journal of Electron Microscopy. (1997) 281-292
  • 李春飛, BANDO, Yoshio, NAKAMURA, Masaki, 君塚昇. A modulated structure of In2O3(ZnO)m as revealed by high-resolution electron microscopy. Journal of Electron Microscopy. (1997) 119-127
  • BANDO, Yoshio, NAKANO, Satoshi, KURASHIMA, Keiji. A new cubic B-C-N compound revealed by high-resolution analytical electron microscopy. Journal of Electron Microscopy. (1996) 135-142
  • 古屋一夫, 斎藤鉄哉, 山田勇, 畑喬雄, K. Furuya, T. Saito, I. Yamada, T. Hata. In Situ Microlithography of Si and GaAs by a Focused Ion Beam in a 200 keV TEM. Journal of Electron Microscopy. 45 [4] (1996) 291-297 10.1093/oxfordjournals.jmicro.a023445
  • 古屋一夫, 大崎光明, 淡路晃弘, 斎藤鉄哉, K. Furuya, M. Osaki, M. Awaji, T. Saito. Practical Performance of Energy-Dispersive X-Ray Spectroscopy with a High-Voltage TEM up to 1,000 kV. Journal of Electron Microscopy. 45 [4] (1996) 285-290 10.1093/oxfordjournals.jmicro.a023444
  • ▲ページトップへ移動