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論文・分野で探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2022年12月08日

89件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • Masaaki Kobata, Igor Píš, Hiroshi Nohira, Hideo Iwai, Keisuke Kobayashi. Application of Cr Kα X-ray photoelectron spectroscopy system to overlayer thickness determination. Surface and Interface Analysis. 43 [13] (2011) 1632-1635 10.1002/sia.3760
  • S. Tanuma, C. J. Powell, D. R. Penn. Calculations of electron inelastic mean free paths. IX. Data for 41 elemental solids over the 50 eV to 30 keV range. Surface and Interface Analysis. 43 [3] (2011) 689-713 10.1002/sia.3522
  • JIN, Hua, YOSHIKAWA, Hideki, TANUMA, Shigeo, Sven Tougaard. Energy loss function for Si determined from reflection electron energy loss spectra with factor analysis method. SURFACE AND INTERFACE ANALYSIS. (2010) 1076-1081
  • Dahlang Tahir, Eun Hye Choi, Young Joon Cho, Suhk Kun Oh, Hee Jae Kang, Hua Jin, Sung Heo, Jae Gwan Chung, Jae Cheol Lee, Sven Tougaard. Electronic and optical properties of La-aluminate dielectric thin films on Si (100). Surface and Interface Analysis. 42 [10-11] (2010) 1566-1569 10.1002/sia.3590
  • T. Nagatomi, S. Tanuma, K. Goto. Absolutely determined inelastic mean free paths for 300–3000 eV electrons in 10 elemental solids. Surface and Interface Analysis. 42 [10-11] (2010) 1537-1540 10.1002/sia.3570
  • Miyoko Tanaka, Atsushi Teraoka, Masayuki Shimojo. Magic Cluster Arrays of In and In/Ag Compound on Si(111)-7×7 studied by UHV-TEM / STM. Surface and Interface Analysis. 42 [10-11] (2010) 1520-1523 10.1002/sia.3579
  • Slavomir Nemsak, Tomas Skala, Michiko Yoshitake, Nataliya Tsud, Taeyoung Kim, Shinjiro Yagyu, Vladimir Matolin. Growth of thin epitaxial alumina films onto Ni(111): an electron spectroscopy and diffraction study. Surface and Interface Analysis. 42 [10-11] (2010) 1581-1584 10.1002/sia.3582
  • Taeyoung Kim, Michiko Yoshitake, Shinjiro Yagyu, Slavomir Nemsak, Takahiro Nagata, Toyohiro Chikyow. XPS study on band alignment at PtO-terminated ZnO(0001) interface. Surface and Interface Analysis. 42 [10-11] (2010) 1528-1531 10.1002/sia.3601
  • Mitsuhiro Okuda, Masaki Takeguchi, Yufang Zhu, Ayako Hashimoto, Nobuhiro Ogawa, Motohiro Tagaya, Song Chen, Nobutaka Hanagata, Toshiyuki Ikoma. Structural analysis of rattle-type hollow mesoporous silica spheres using electron tomography and energy filtered imaging. Surface and Interface Analysis. 42 [10-11] (2010) 1548-1551 10.1002/sia.3572
  • M. Yoshitake, K. Ohmori, T. Chikyow. Interface characterization of a metal-oxide-semiconductor structure by biased X-ray photoelectron spectroscopy. Surface and Interface Analysis. 42 [2] (2010) 70-76 10.1002/sia.3154
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