| 98件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| Yasuko Kajiwara, Hideo Iwai, Noriko Kodani, Catharina T. Migita, Akira Yano, Satoka Aoyagi. Multivariate analysis and g-ogram application to ToF-SIMS data of PEG mixed model sample. Surface and Interface Analysis. 46 [12-13] (2014) 1183-1186 10.1002/sia.5591 | |
| Satoka Aoyagi, Noriko Kodani, Akira Yano, Toshiki Asao, Hideo Iwai, Masahiro Kudo. ToF-SIMS data analysis for complex plant tissue samples using multivariate analysis and G-SIMS. Surface and Interface Analysis. 46 [S1] (2014) 131-135 10.1002/sia.5588 | |
| Yasuko Kajiwara, Hideo Iwai, Keizo Nakagawa, Noriko Kodani, Satoka Aoyagi. Evaluation of hydroxyapatite nanoparticles synthesized with phosphate surfactant by means of G-SIMS and g-ogram. Surface and Interface Analysis. 46 [S1] (2014) 209-212 10.1002/sia.5398 | |
| Akiya Karen, Kimihiko Ito, Yoshimi Kubo. TOF-SIMS analysis of lithium air battery discharge products utilizing gas cluster ion beam sputtering for surface stabilization. Surface and Interface Analysis. 46 [S1] (2014) 344-347 10.1002/sia.5508 | |
| Klára Ševčíková, Václav Nehasil, Tatiana Zahoranová, Mykhaylo Vorokhta, Nataliya Tsud, Hideki Yoshikawa, Masaaki Kobata, Keisuke Kobayashi, Vladimír Matolín. The effect of the substrate on thermal stability of CeOxand Rh-Ce-O thin films. Surface and Interface Analysis. 46 [10-11] (2014) 980-983 10.1002/sia.5503 | |
| Hideki Yoshikawa, Kazuhiro Yoshihara, Daisuke Watanabe, Hiromi Tanaka, Shigeo Tanuma. Proposal for common data transfer format for simulation softwares used in surface electron spectroscopies. Surface and Interface Analysis. 46 [10-11] (2014) 931-935 10.1002/sia.5390 | |
| Yasuko Kajiwara, Hideo Iwai, Noriko Kodani, Catharina T. Migita, Akira Yano, Satoka Aoyagi. Multivariate analysis and g-ogram application to ToF-SIMS data of PEG mixed model sample. Surface and Interface Analysis. 46 [12-13] (2013) 1183-1186 | |
| Mineharu Suzuki, Sei Fukushima, Shigeo Tanuma. Efficiency of automated peak identification with daily used commercial software for X-ray photoelectron spectra - report from VAMAS/TWA 2/A 9 project. Surface and Interface Analysis. 45 [7] (2013) 1174-1181 10.1002/sia.5245 | |
| H. Jin, H. Shinotsuka, H. Yoshikawa, H. Iwai, M. Arai, S. Tanuma, S. Tougaard. Evaluation of robustness to surface conditions of the target factor analysis method for determining the dielectric function from reflection electron energy loss spectra: Application to GaAs. Surface and Interface Analysis. 45 [6] (2013) 985-992 10.1002/sia.5196 | |
| Juanjuan Xing, Masaki Takeguchi, Miyoko Tanaka, Yoshiko Nakayama. Redox of NiO thin film on YSZ (111) substrate. Surface and Interface Analysis. 44 [11-12] (2012) 1483-1487 10.1002/sia.4982 | |
