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機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています（Materials Science, Physics, Chemistry, Engineering, Biologyなど）。
最終更新日: 2026年09月06日
| 71件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| Koji Kimoto, Kazuo Ishizuka. Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series. Microscopy and Microanalysis. 20 [S3] (2014) 936-937 10.1017/s1431927614006400 | |
| Emi Kano, Ayako Hashimoto, Masaki Takeguchi. In-situ TEM Observation of Pt-terminating Carbyne on Graphene. Microscopy and Microanalysis. 20 [S3] (2014) 1742-1743 10.1017/s1431927614010447 | |
| T. Hara, K. Maehata, K. Mitsuda, N.Y. Yamasaki, K. Tanaka, Y. Yamanaka. Development of an Analytical TEM with a TES Microcalorimeter EDS. Microscopy and Microanalysis. 19 [S2] (2013) 1260-1261 10.1017/s1431927613008295 | |
| K. Kumagai, T. Sekiguchi. Estimation of Energy Acceptance of SE Detectors in Scanning Electron Microscopy. Microscopy and Microanalysis. 19 [S2] (2013) 1196-1197 10.1017/s1431927613007976 | |
| Pengfei Yan, Toshiyuki Mori, Yuanyuan Wu, Zhimin Li, Graeme John Auchterlonie, Jin Zou, John Drennan. Microstructural and Chemical Characterization of Ordered Structure in Yttrium Doped Ceria. Microscopy and Microanalysis. 19 [1] (2013) 102-110 10.1017/s1431927612013888 | |
| K. Kimoto, K. Ishizuka. Spatially-Resolved Diffractometry with Atomic-Column Resolution. Microscopy and Microanalysis. 18 [S2] (2012) 328-329 10.1017/s1431927612003492 | |
| P. M. F. J. Costa, U.K. Gautam, Y. Bando, D. Golberg. Effect of Electron Beam Irradiation and Heating on the Structural Stability of Sulphide-Filled Carbon Nanotubes. Microscopy and Microanalysis. 18 [S5] (2012) 77-78 10.1017/s1431927612013049 | |
| Fei Ye, Ding Rong Ou, Toshiyuki Mori. Microstructural Evolution in a CeO2-Gd2O3 System. Microscopy and Microanalysis. 18 [1] (2012) 162-170 10.1017/s1431927611012396 | |
| Xiaobin Zhang, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, Meguru Tezuka, Masayuki Shimojo. Improvement of Depth Resolution of ADF-SCEM by Deconvolution: Effects of Electron Energy Loss and Chromatic Aberration on Depth Resolution. Microscopy and Microanalysis. 18 [3] (2012) 603-611 10.1017/s1431927612000062 | |
| M Takeguchi, K Mitsuishi, D Lei, M Shimojo. Development of sample-scanning electron holography. Microscopy and Microanalysis. 17 [S2] (2011) 1230-1231 10.1017/s1431927611007021 | |
