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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています（Materials Science, Physics, Chemistry, Engineering, Biologyなど）。

最終更新日: 2026年01月23日

68件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ）
  • X. Yu. TEM Study of the influence of antisite defects on magnetic domain structures in double perovskite Ba2FeMoO6. Journal of Electron Microscopy. 54 [1] (2005) 61-65 10.1093/jmicro/dfh104
  • S. Ohsaki. Focused ion beam fabrication of field-ion microscope specimens from mechanically milled pearlitic steel powder. Journal of Electron Microscopy. 53 [5] (2004) 523-525 10.1093/jmicro/dfh054
  • H. Matsuhata. Behaviors of surfactant atoms on Si(001) surface. Journal of Electron Microscopy. 53 [4] (2004) 325-337 10.1093/jmicro/dfh043
  • T. Tsuruoka. Optical characterization of individual semiconductor nanostructures using scanning tunneling microscope. Journal of Electron Microscopy. 53 [2] (2004) 169-175 10.1093/jmicro/53.2.169
  • J. M. Howe. Effects of heat and electron irradiation on the melting behavior of Al?Si alloy particles and motion of the Al nanosphere within. Journal of Electron Microscopy. 53 [2] (2004) 107-114 10.1093/jmicro/53.2.107
  • Z.-Q. Liu. Detection of iron-oxide layer on the surface of iron nitride using high-resolution electron microscopy and Fourier filtering. Journal of Electron Microscopy. 53 [2] (2004) 143-148 10.1093/jmicro/53.2.143
  • T. Sekiguchi. Cathodoluminescence study of one-dimensional free-standing widegap-semiconductor nanostructures - GaN nanotubes, Si3N4 nanobelts. Journal of Electron Microscopy. 53 [2] (2004) 203-208 10.1093/jmicro/53.2.203
  • D. Fujita. Novel local density of state mapping technique for low-dimensional systems. Journal of Electron Microscopy. 53 [2] (2004) 177-185 10.1093/jmicro/53.2.177
  • T. Sekiguchi. Cathodoluminescence study of AlGaAs/GaAs multilayers grown on the ridge-type triangles on GaAs (111)A substrates. Journal of Electron Microscopy. 52 [4] (2003) 383-389 10.1093/jmicro/52.4.383
  • K. Kimoto. The study of Al-L23 ELNES with resolution-enhancement software and first-principles calculation. Journal of Electron Microscopy. 52 [3] (2003) 299-303 10.1093/jmicro/52.3.299

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