| 27件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
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| M. Shimojo, K. Mitsuishi, A. Tameike, K. Furuya. Electron induced nano-deposition of tungsten using field emission scanning and transmission electron microscopes. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22 [2] (2004) 742 10.1116/1.1688349 | |
| Guoqiang Xie, Minghui Song, Kazutaka Mitsuishi, Kazuo Furuya. Fabrication of Ordered Array of Tungsten Nanoparticles on Anodic Porous Alumina by Electron Beam Induced Selective Deposition. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22 [6] (2004) 2589 10.1116/1.1814108 | |
| Takanori Ichiki, Yoshinari Sugiyama, Takekazu Ujiie, Yasuhiro Horiike. Deep Dry Etching of Borosilicate Glass using Fluorine-based High-density plasmas for Microelectromechanical System Fabrication. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21 [5] (2003) 2188 10.1116/1.1612935 | |
| S. F. Chichibu, T. Onuma, T. Aoyama, K. Nakajima, P. Ahmet, T. Chikyow, T. Sota, S. P. DenBaars, S. Nakamura, T. Kitamura, Y. Ishida, H. Okumura. Recombination dynamics of localized excitons in cubic InxGa1-xN/GaN multiple quantum wells grown by radio frequency molecular be. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21 [4] (2003) 1856 10.1116/1.1593645 | |
| X. Ju, M. Kurahashi, T. Suzuki, Y. Yamauchi. patterning of gold film on muscovite mica by using a helium-metastable atom beam and an octanethiol self-assembled monolayer. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 21 [6] (2003) 2478 10.1116/1.1615981 | |
| Z. Q. Zou, Z. C. Dong, A. S. Trifonov, H. Nejo. Atomic resolution imaging of a single-crystal Cu(100) surface by scanning tunneling microscopy in ultrahigh vacuum at room tempe. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20 [4] (2002) 1567 10.1116/1.1495903 | |
| P. Dorozhkin, H. Nejoh, D. Fujita, Pavel, Dorozhkin, NEJO, Hitoshi. Low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer-scale objects. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20 [3] (2002) 1044 10.1116/1.1481756 | |
| Zou Zhiqiang, DONG, Zhen-Chao, Artem Trifonov, NEJO, Hitoshi. Atomic resolution imaging of a single-crystal Cu (100) surface by STM in ultrahigh vacuum at room temperature. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B. [4] (2002) 1567-1569 | |
| Pavel Dorozhkin, 根城均, D. Fujita, P. Dorozhkin, H. Nejoh. The low-energy electron point source microscope as a tool for transport measurements of free-standing nanometer scale objects: a. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 20 [3] (2002) 1044 | |
| M. Mitome, M. Okamoto, Y. Bando, H. Yamamura. Structure analysis of Ba2In2O5 and related compounds by elecron microscopy. Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 19 [6] (2001) 2284 10.1116/1.1421566 | |
