29件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ) | |
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Y. Sassa, M. Månsson, O.K. Forslund, O. Tjernberg, V. Pomjakushin, O. Ofer, E.J. Ansaldo, J.H. Brewer, I. Umegaki, Y. Higuchi, Y. Ikedo, H. Nozaki, M. Harada, I. Watanabe, H. Sakurai, J. Sugiyama. The metallic quasi-1D spin-density-wave compound NaV 2 O 4 studied by angle-resolved photoelectron spectroscopy. Journal of Electron Spectroscopy and Related Phenomena. 224 (2018) 79-83 10.1016/j.elspec.2017.05.010 | |
Takuya Masuda, Kohei Uosaki, MASUDA, Takuya, UOSAKI, Kohei. In situ determination of electronic structure at solid/liquid interfaces. Journal of Electron Spectroscopy and Related Phenomena. 221 (2017) 88-98 10.1016/j.elspec.2017.03.012 | |
H. Sato, H. Nagata, F. Iga, Y. Osanai, A. Rousuli, K. Mimura, H. Anzai, K. Ichiki, S. Ueda, T. Takabatake, A. Kondo, K. Kindo, K. Shimada, H. Namatame, M. Taniguchi. Different valence states of Tm in YB 6 and YbB 6. Journal of Electron Spectroscopy and Related Phenomena. 220 (2017) 33-36 10.1016/j.elspec.2017.03.006 | |
Katsuya Ichiki, Takayuki Matsumoto, Hiroaki Anzai, Ryohei Takeshita, Kodai Abe, Suzuna Ishihara, Takayuki Uozumi, Hitoshi Sato, Awabaikeli Rousuli, Shigenori Ueda, Yukihiro Taguchi, Kenya Shimada, Hirofumi Namatame, Masaki Taniguchi, Suguru Hamano, Akihiro Mitsuda, Hirofumi Wada, Kojiro Mimura. Valence transition in polycrystalline Eu(Rh 1–x Co x ) 2 Si 2 studied by hard x-ray photoemission spectroscopy. Journal of Electron Spectroscopy and Related Phenomena. 220 (2017) 28-32 10.1016/j.elspec.2017.03.014 | |
D. Eiteneer, G.K. Pálsson, S. Nemšák, A.X. Gray, A.M. Kaiser, J. Son, J. LeBeau, G. Conti, A.A. Greer, A. Keqi, A. Rattanachata, A.Y. Saw, A. Bostwick, E. Rotenberg, E.M. Gullikson, S. Ueda, K. Kobayashi, A. Janotti, C.G. Van de Walle, A. Blanca-Romero, R. Pentcheva, C.M. Schneider, S. Stemmer, C.S. Fadley. Depth-Resolved Composition and Electronic Structure of Buried Layers and Interfaces in a LaNiO 3 /SrTiO 3 Superlattice from Soft- and Hard- X-ray Standing-Wave Angle-Resolved Photoemission. Journal of Electron Spectroscopy and Related Phenomena. 211 (2016) 70-81 10.1016/j.elspec.2016.04.008 | |
Ryo Matsumoto, Yugo Nishizawa, Noriyuki Kataoka, Hiromi Tanaka, Hideki Yoshikawa, Shigeo Tanuma, Kazuhiro Yoshihara. Reproducibility of XPS analysis for film thickness of SiO2/Si by active Shirley method. Journal of Electron Spectroscopy and Related Phenomena. 207 (2016) 55-59 10.1016/j.elspec.2015.12.008 | |
Susumu Yanagisawa, Koji Okuma, Takeshi Inaoka, Ikutaro Hamada. Recent progress in predicting structural and electronic properties of organic solids with the van der Waals density functional. Journal of Electron Spectroscopy and Related Phenomena. 204 (2015) 159-167 10.1016/j.elspec.2015.04.007 | |
Keisuke Kobayashi, Masaaki Kobata, Hideo Iwai. Development of a laboratory system hard X-ray photoelectron spectroscopy and its applications. Journal of Electron Spectroscopy and Related Phenomena. 190 (2013) 210-221 10.1016/j.elspec.2013.04.007 | |
UEDA, Shigenori. Application of hardX-ray photoelectron spectroscopy to electronics tructure measurements for various functional materials. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. 190 [Part B] (2013) 235-241 | |
Nobuyuki Ishida, Daisuke Fujita. Chemical-state imaging of Li using scanning Auger electron microscopy. Journal of Electron Spectroscopy and Related Phenomena. 186 (2013) 39-43 10.1016/j.elspec.2013.03.001 | |