論文・分野から探す
機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています（Materials Science, Physics, Chemistry, Engineering, Biologyなど）。
最終更新日: 2026年03月09日
| 104件の論文が見つかりました。論文は出版年月日順に表示しています。（ヘルプ） | |
|---|
| 吉原一紘. Summary of ISO/TC201 Standarad: ISO14975:2000-Surface Chemical Analysis -Data information formats. Surface and Interface Analysis. (2001) | |
| 吉原一紘, 田中彰博. Interlaboratory Study on the Degradation of Organic Materials by X-rays in XPS. Surface and Interface Analysis. (2001) | |
| TAKEGUCHI, Masaki, TANAKA, Miyoko, 保田英洋, FURUYA, Kazuo. Analytical ultrahigh-vacuum transmission electron microscopy applied to the study of Pd2Si island formation on Si (111) surfaces. Journal of surface and interface analysis. (2001) 68-72 | |
| 浅見勝彦, 秋山英二, 橋本功二. Angle-resolved XPS for determination of diffusion coefficients and mobilities of cations in thin passive films. Surface and Interface Analysis. (2000) 106-111 | |
| 竹口雅樹, 呉源, 古屋一夫. Atomic structure of steps on Si(113)surface studied by direct HRTEM observation. Surface and Interface Analysis. (2000) 288-291 | |
| YOSHITAKE, Michiko, 吉原一紘, 吉原一紘. Round Robin on Spectrometer Transmission Calibration for AES in the Common Data Processing System. Surface and Interface Analysis. 25 (1997) 209-216 10.1002/(sici)1096-9918(199703)25:3<209::aid-sia228>3.0.co;2-t | |
| Daisuke Fujita, Malika Schleberge, Sven Tougaard, Daisuke Fujita, Malika Schleberge, Sven Tougaard. Estimation of Excitation Depth Distribution from Electron-excited Auger Spectra of Iron Using Peak Shape Analysis. Surface and Interface Analysis. 24 (1996) 211-216 10.1002/(sici)1096-9918(199603)24:3<211::aid-sia99>3.0.co;2-m | |
| Daisuke Fujita, 吉原一紘, 吉原一紘, Kazuhiro Yoshihara. Parctical Energy Scale Calibration Procedure for Auger Electron Spectrometers Using a Spectrometer Offset Function.. Surface and Interface Analysis. 21 [4] (1994) 226-230 10.1002/sia.740210403 | |
| 吉原一紘, D.W.Moon, K. Yoshihara, D. W. Moon, D. Fujita, K. J. Kim, K. Kajiwara. GaAs/AlAs Superlattice as a Proposed New Reference Material for the Sputter Depth Profiling.. Surface and Interface Analysis. 20 [13] (1993) 1061-1066 10.1002/sia.740201306 | |
| . . Surface and Interface Analysis. 18 (1992) 18 | |
