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You can search NIMS articles by Clarivate ESI category (Materials Science, Physics, Chemistry, Engineering, Biology and etc.), title and terms from abstract.

Last updated: October 06, 2026

71 article(s) found. Sorted by publication dates. (Help)
  • 田中美代子, 古屋一夫, 齋藤鐵哉, Miyoko Tanaka, Kazuo Furuya, Tetsuya Saito. Focused Ion Beam Interfaced with a 200 keV Transmission Electron Microscope for In Situ Micropatterning on Semiconductors. Microscopy and Microanalysis. 4 [3] (1998) 207-217 10.1017/s1431927698980205

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