| 68 article(s) found. Sorted by publication dates. (Help) | |
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| 池田省三, 池田省三. Setting of a Low Proce CCD Camera on the View Window of TEM for Pronting Out Electron Diffraction Patterns. Journal of Electron Microscopy. 44 (1995) 485-487 | |
| 末松久幸, BANDO, Yoshio, 三友護. Plasma Etching of TEM Samples for Observing Grain Boundary in Silicon Nitride. Journal of Electron Microscopy. (1994) | |
| 内田信也, BANDO, Yoshio, NAKAMURA, Masaki, 君塚昇. High-resolution electron microscopy of homologous compounds InFeO3(ZnO)m. Journal of Electron Microscopy. (1994) 146 | |
| B.辞破浚, 池田省三, 池田省三, B.辞破浚, 池田省三, 池田省三. Temperature Rise of a Superconducting Oxide Bi2Sr2CaCu2O8 Sample during Argon Ion Milling.. Journal of Electron Microscopy. 41 [3] (1992) 196-198 | |
| BANDO, Yoshio, 高橋裕, TANAKA, Hidehiko, SUGA, Tadatomo. High Voltage Electron Microscopy of Crack TiP Dislocations in MgO. Journal of Electron Microscopy. (1991) 325-336 | |
| 松井良夫, 柳沢佳寿美, IZUMI, Fujio, 堀内繁雄, 山田裕, 松本武彦, 池田省三, 児玉泰治. High-Resolution Transmission Electron Microscopy of Planar Defects Ca-Doped YBCO/(1-2-4) High-Tc Superconductors Y1-xCaxBa2Cu4O. Journal of Electron Microscopy. (1991) 221-228 | |
| 松井良夫, TAKEKAWA, Shunji, 堀内繁雄, 正田薫, 梅園明弘, 中村幸子, 鶴田忠正. High-Resolution Transmission Electron Microscopy of Modulated Structures and Defects in Bi-Sr-Ca-Cu-O Superconductors Prepared b. Journal of Electron Microscopy. (1990) 223-230 | |
| BANDO, Yoshio. Analytical Transmission Electron Microscopy of Materials in Japan. Journal of Electron Microscopy. (1989) 81 | |
| 松井良夫, BANDO, Yoshio, 北見喜三, J.L.Hutchison. . Journal of Electron Microscopy (Special Issue). (1987) 395 | |
| BANDO, Yoshio, 及川哲夫, 柴田信正, 中西和教, 小久保靖. An EELS spectrometer with a double dispersion lens for a medium voltage TEM. Journal of Electron Microscopy. (1986) 353 | |
