| 98 article(s) found. Sorted by publication dates. (Help) | |
|---|
| Mitsuhiro Okuda, Masaki Takeguchi, Yufang Zhu, Ayako Hashimoto, Nobuhiro Ogawa, Motohiro Tagaya, Song Chen, Nobutaka Hanagata, Toshiyuki Ikoma. Structural analysis of rattle-type hollow mesoporous silica spheres using electron tomography and energy filtered imaging. Surface and Interface Analysis. 42 [10-11] (2010) 1548-1551 10.1002/sia.3572 | |
| M. Yoshitake, K. Ohmori, T. Chikyow. Interface characterization of a metal-oxide-semiconductor structure by biased X-ray photoelectron spectroscopy. Surface and Interface Analysis. 42 [2] (2010) 70-76 10.1002/sia.3154 | |
| KIMURA Kenji, NAKAJIMA Kaoru, ZHAO Ming, NOHIRA Hiroshi, HATTORI Takeo, KOBATA Masaaki, IKENAGA Eiji, KIM Jun Jin, KOBAYASHI, Keisuke, CORNARD Thierry, VANDERVORST Wilfried. Combination of high-resolution RBS and angle-resolved XPS: accurate depth profiling of chemical states. SURFACE AND INTERFACE ANALYSIS. (2008) 423-426 | |
| UEMURA, Takafumi, Akai-Kasaya Megumi, Saito Akira, AONO, Masakazu, Kuwahara Yuji. Spatially resolved detection of plasmon-enhanced fluorescence using scanning tunneling microscopy. SURFACE AND INTERFACE ANALYSIS. (2008) 1050-1053 | |
| Akai-Kasaya Megumi, Higuchi Yuichi, Yura Kayo, Yoshida Akihito, Saito Akira, AONO, Masakazu, Kuwahara Yuji. Polymerization-direction-controlled growth of polydiacetylene on artificial silicon oxide templates. SURFACE AND INTERFACE ANALYSIS. (2008) 1037-1041 | |
| Saito Akira, Takagi Yasutaka, Takahashi Koji, Hosokawa Hiromasa, Hanai Kazuhisa, Tanaka Takehiro, Akai-Kasaya Megumi, Tanaka Yoshihito, Shin Shik, Ishikawa Tetsuya, Kuwahara Yuji, AONO, Masakazu. Nanoscale elemental identification by synchrotron-radiation-based scanning tunneling microscopy. SURFACE AND INTERFACE ANALYSIS. (2008) 1033-1036 | |
| ENDERS, Dominik, NAGAO, Tadaaki, NAKAYAMA, Tomonobu, AONO, Masakazu. Optically monitored wet-chemical preparation of SEIRA active Au nanostructures. SURFACE AND INTERFACE ANALYSIS. (2008) 1681-1683 | |
| TANAKA, Miyoko, TAKEGUCHI, Masaki, FURUYA, Kazuo. Wavelength dispersive X-ray spectroscopy of thick and thin samples for electron microscopes. SURFACE AND INTERFACE ANALYSIS. (2008) 1684-1687 | |
| Takashi Doi, Kazuyuki Kitamura, Yoshitaka Nishiyama, Nobuo Otsuka, Takeo Kudo, Masugu Sato, Eiji Ikenaga, Shigenori Ueda, Keisuke Kobayashi. Analysis of Cu segregation to oxide-metal interface of Ni-based alloy in a metal-dusting environment. Surface and Interface Analysis. 40 [10] (2008) 1374-1381 10.1002/sia.2910 | |
| Mineharu Suzuki, Sei Fukushima, Shigeo Tanuma. Efficiency of Visual Peak Detection in X-ray Photoelectron Spectra. Surface and Interface Analysis. 40 [10] (2008) 1337-1343 10.1002/sia.2894 | |
