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論文・分野から探す

機構に所属する研究者の発表した論文を、タイトル・抄録・分野などから検索することができます。論文の分野はクラリベイト社のESI分類を参考に分類しています(Materials Science, Physics, Chemistry, Engineering, Biologyなど)。

最終更新日: 2024年03月29日

60件の論文が見つかりました。論文は出版年月日順に表示しています。(ヘルプ)
  • Michiko Yoshitake, Shinjiro Yagyu. The effect of bias voltage on the measurement of local barrier height. Surface and Interface Analysis. 36 [8] (2004) 1106-1109 10.1002/sia.1851
  • Michiko Yoshitake, Yasuhiro Yamauchi, Chandra Bose. Sputtering rate measurements of some transition metal silicides and comparison with those of the elements. Surface and Interface Analysis. 36 [8] (2004) 801-804 10.1002/sia.1768
  • T. Oishi, M. Goto, A. Kasahara, M. Tosa. Low frictional copper oxide film prepared with sodium hydroxide solution. Surface and Interface Analysis. 36 [8] (2004) 1259-1261 10.1002/sia.1889
  • M. Yoshitake, S. Bera, Y. Yamauchi. AES and LEED study of well-ordered oxide film grown on Cu-9at%Al(111). Surface and Interface Analysis. 35 [10] (2003) 824-828 10.1002/sia.1610
  • K. Miyazawa, Y. Kuwasaki, K. Hamamoto, S. Nagata, A. Obayashi, M. Kuwabara, MIYAZAWA, Kunichi, 桑崎悠介, 濱本孝一, 長田悟, 大林昭雄, 桑原誠. Structural characterization of C60 nanowhiskers formed by the liquid/liquid interfacial precipitation method. Surface and Interface Analysis. 35 [1] (2003) 117-120
  • K. Miyazawa, Y. Kuwasaki, K. Hamamoto, S. Nagata, A. Obayashi, M. Kuwabara. Structural characterization of the C60 nanowhiskers formed by the liquid-liquid interfacial precipitation method. Surface and Interface Analysis. 35 [1] (2003) 117-120 10.1002/sia.1506
  • YOSHITAKE, Michiko, 吉原一紘, 吉原一紘. Round Robin on Spectrometer Transmission Calibration for AES in the Common Data Processing System. Surface and Interface Analysis. 25 (1997) 209-216 10.1002/(sici)1096-9918(199703)25:3<209::aid-sia228>3.0.co;2-t
  • Daisuke Fujita, Malika Schleberge, Sven Tougaard, Daisuke Fujita, Malika Schleberge, Sven Tougaard. Estimation of Excitation Depth Distribution from Electron-excited Auger Spectra of Iron Using Peak Shape Analysis. Surface and Interface Analysis. 24 (1996) 211-216 10.1002/(sici)1096-9918(199603)24:3<211::aid-sia99>3.0.co;2-m
  • . . Surface and Interface Analysis. 18 (1992) 18
  • M. Yoshitake, 吉原一紘, 吉原一紘, K. Yoshihara. Surface Segregation of Substrate Element on Metal Films in Film/Substrate Combination with Nb, Ti, and Cu.. Surface and Interface Analysis. 18 [7] (1992) 509-513 10.1002/sia.740180710
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