Accurate synchrotron hard X-ray diffraction measurements on high-temperature liquid oxides

Koji OHARA; Yohei ONODERA; Shinji KOHARA; Chihiro KOYAMA; Atsunobu MASUNO; Akitoshi MIZUNO; Jumpei T. OKADA; Shuta TAHARA; Yuki WATANABE; Hirohisa ODA; Yui NAKATA; Haruka TAMARU; Takehiko ISHIKAWA; Osami SAKATA; Koji OHARA; Yohei ONODERA; Shinji KOHARA; Chihiro KOYAMA; Atsunobu MASUNO; Akitoshi MIZUNO; Jumpei T. OKADA; Shuta TAHARA; Yuki WATANABE; Hirohisa ODA; Yui NAKATA; Haruka TAMARU; Takehiko ISHIKAWA; Osami SAKATA

doi:10.15011/jasma.37.2.370202

Accurate synchrotron hard X-ray diffraction measurements on high-temperature liquid oxides

Koji OHARA, Yohei ONODERA, Shinji KOHARA, Chihiro KOYAMA, Atsunobu MASUNO, Akitoshi MIZUNO, Jumpei T. OKADA, Shuta TAHARA, Yuki WATANABE, Hirohisa ODA, Yui NAKATA, Haruka TAMARU, Takehiko ISHIKAWA, Osami SAKATA.

International journal of microgravity science and application 370202. 2020.

https://doi.org/10.15011/jasma.37.2.370202

NIMS author(s)

KOHARA, Shinji

Fulltext and dataset(s) on Materials Data Repository (MDR)

Created at: 2020-06-04 03:00:22 +0900Updated at: 2024-09-12 08:48:41 +0900