HOME > Article > DetailElectrically Benign Defect Behavior in Zinc Tin Nitride Revealed from First PrinciplesNaoki Tsunoda, Yu Kumagai, Akira Takahashi, Fumiyasu Oba. Physical Review Applied 10 [1] 011001. 2018.https://doi.org/10.1103/physrevapplied.10.011001 Open Access American Physical Society (APS) (Publisher) NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-04-17 03:11:19 +0900Updated at: 2025-01-09 05:27:11 +0900