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Reduction of charge injection barrier by 1-nm contact oxide interlayer in organic field effect transistors

Peter Darmawan, Takeo Minari, Akichika Kumatani, Yun Li, Chuan Liu, Kazuhito Tsukagoshi.
Applied Physics Letters 100 [1] 013303. 2012.
https://doi.org/10.1063/1.3673842

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