HOME > Article > DetailOrigin of low-frequency noise in pentacene field-effect transistorsYong Xu, Takeo Minari, Kazuhito Tsukagoshi, Jan Chroboczek, Francis Balestra, Gerard Ghibaudo. Solid-State Electronics 61 [1] 106-110. 2011.https://doi.org/10.1016/j.sse.2011.01.002 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:19:51 +0900Updated at: 2024-04-02 02:47:10 +0900
