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Communication—A Powerful Method to Improve Dielectric/GaN Interface Properties: A Dummy SiO₂ Process

Yoshihiro Irokawa, Toshihide Nabatame, Tomomi Sawada, Manami Miyamoto, Hiromi Miura, Kazuhito Tsukagoshi, Yasuo Koide.

ECS Journal of Solid State Science and Technology 13 [8] 085003. 2024.

https://doi.org/10.1149/2162-8777/ad6fd2

Open Access The Electrochemical Society (Publisher) Materials Data Repository (MDR)

NIMS author(s)

Fulltext and dataset(s) on Materials Data Repository (MDR)

MDRavailable Communication—A Powerful Method to Improve Dielectric/GaN Interface Properties: A Dummy SiO<sub>2</sub> Process

Created at: 2024-08-31 03:13:45 +0900 Updated at: 2026-08-23 04:32:06 +0900

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