HOME > Article > DetailEvidence for a general mechanism modulating carrier lifetime in SiCBin Chen, Takashi Sekiguchi, Takasumi Ohyanagi, Hirofumi Matsuhata, Akimasa Kinoshita, Hajime Okumura. Physical Review B 81 [23] 233203. 2010.https://doi.org/10.1103/physrevb.81.233203 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:07:42 +0900Updated at: 2024-04-02 06:04:12 +0900
