HOME > Article > DetailAnalysis of indium diffusion profiles based on the Fermi-level effect in single-crystal zinc oxideTsubasa Nakagawa, Kenji Matsumoto, Isao Sakaguchi, Masashi Uematsu, Hajime Haneda, Naoki Ohashi. Japanese Journal of Applied Physics 47 [10] 7848-7850. 2008.https://doi.org/10.1143/jjap.47.7848 NIMS author(s)SAKAGUCHI, IsaoHANEDA, HajimeOHASHI, NaokiFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 15:36:57 +0900Updated at: 2024-09-05 04:42:46 +0900
