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Bottom-electrode effect on switching behavior and interface reaction in nanoionic-based resistive changing memory

Takahiro Nagata, Yoshiyuki Yamashita, Hideki Yoshikawa, Masataka Imura, Seungjun Oh, Kazuyoshi Kobashi, Toyohiro Chikyow.
Japanese Journal of Applied Physics 55 [8S2] 08PC03. 2016.
https://doi.org/10.7567/jjap.55.08pc03

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