HOME > Article > DetailNon-destructive detection of killer defects of diamond Schottky barrier diodesShinya Ohmagari, Tokuyuki Teraji, Yasuo Koide. Journal of Applied Physics 110 [5] 056105. 2011.https://doi.org/10.1063/1.3626791 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 16:27:30 +0900Updated at: 2024-03-31 14:45:20 +0900
