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Electrical conductivity measurement of silicon wire prepared by CVD
(CVD法で作製したSiワイヤーの電気抵抗測定)

Hiroshi Suzuki, Hiroshi Araki, Masahiro Tosa, Tetsuji Noda.
Chemical Physics Letters 468 [4-6] 211-215. 2009.
https://doi.org/10.1016/j.cplett.2008.11.090

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