HOME > Article > DetailDirect observation of electronic structure change by resistance random access memory effect in amorphous aluminaMasato Kubota, Seisuke Nigo, Seiichi Kato, Kenta Amemiya. AIP Advances 9 [9] 095050. 2019.https://doi.org/10.1063/1.5086212 Open Access AIP Publishing (Publisher) NIMS author(s)KATO, SeiichiFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2019-10-19 03:00:21 +0900 Updated at :2020-11-16 22:07:29 +0900