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AuthorMasato Kubota, Seisuke Nigo, Seiichi Kato, Kenta Amemiya.
TitleDirect observation of electronic structure change by resistance random access memory effect in amorphous alumina
Journal titleAIP Advances 9 [9] 095050
ISSN: 21583226
Year of publication2019
LanguageEnglish
ESI category
DOIhttps://doi.org/10.1063/1.5086212
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