Showing Article
| Author | Masato Kubota, Seisuke Nigo, Seiichi Kato, Kenta Amemiya. |
|---|---|
| Title | Direct observation of electronic structure change by resistance random access memory effect in amorphous alumina |
| Journal title | AIP Advances 9 [9] 095050 ISSN: 21583226 |
| Year of publication | 2019 |
| Language | English |
| ESI category | |
| DOI | https://doi.org/10.1063/1.5086212 |
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