HOME > Article > DetailEstimation of Energy Acceptance of SE Detectors in Scanning Electron MicroscopyK. Kumagai, T. Sekiguchi. Microscopy and Microanalysis 19 [S2] 1196-1197. 2013.https://doi.org/10.1017/s1431927613007976 NIMS author(s)Fulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2016-05-24 18:08:46 +0900Updated at: 2024-04-01 21:16:51 +0900
