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Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces

著者Oleksandr Romanyuk, Oliver Supplie, Agnieszka Paszuk, Jan Philipp Stoeckmann, Regan George Wilks, Jakob Bombsch, Claudia Hartmann, Raul Garcia‐Diez, Shigenori Ueda, Igor Bartoš, Ivan Gordeev, Jana Houdkova, Peter Kleinschmidt, Marcus Bär, Petr Jiříček, Thomas Hannappel.
掲載誌名Surface and Interface Analysis 52 [12] 933-938
ISSN: 01422421
ESIでのカテゴリ: PHYSICS
出版社Wiley
発表年2020
言語English
DOIhttps://doi.org/10.1002/sia.6829
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