Oleksandr Romanyuk; Oliver Supplie; Agnieszka Paszuk; Jan Philipp Stoeckmann; Regan George Wilks; Jakob Bombsch; Claudia Hartmann; Raul Garcia‐Diez; Shigenori Ueda; Igor Bartoš; Ivan Gordeev; Jana Houdkova; Peter Kleinschmidt; Marcus Bär; Petr Jiříček; Thomas Hannappel

doi:10.1002/sia.6829

Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces

著者	Oleksandr Romanyuk, Oliver Supplie, Agnieszka Paszuk, Jan Philipp Stoeckmann, Regan George Wilks, Jakob Bombsch, Claudia Hartmann, Raul Garcia‐Diez, Shigenori Ueda, Igor Bartoš, Ivan Gordeev, Jana Houdkova, Peter Kleinschmidt, Marcus Bär, Petr Jiříček, Thomas Hannappel.
掲載誌名	Surface and Interface Analysis 52 [12] 933-938 ISSN: 01422421 ESIでのカテゴリ: PHYSICS
出版社	Wiley
発表年	2020
言語	English
DOI	https://doi.org/10.1002/sia.6829
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