Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces
| Author(s) | Oleksandr Romanyuk, Oliver Supplie, Agnieszka Paszuk, Jan Philipp Stoeckmann, Regan George Wilks, Jakob Bombsch, Claudia Hartmann, Raul Garcia‐Diez, Shigenori Ueda, Igor Bartoš, Ivan Gordeev, Jana Houdkova, Peter Kleinschmidt, Marcus Bär, Petr Jiříček, Thomas Hannappel. |
|---|---|
| Journal title | Surface and Interface Analysis 52 [12] 933-938 ISSN: 01422421 ESI category: PHYSICS |
| Publisher | Wiley |
| Year of publication | 2020 |
| Language | English |
| DOI | https://doi.org/10.1002/sia.6829 |
| Import this reference to Mendeley |  |