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Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces

Oleksandr Romanyuk, Oliver Supplie, Agnieszka Paszuk, Jan Philipp Stoeckmann, Regan George Wilks, Jakob Bombsch, Claudia Hartmann, Raul Garcia‐Diez, Shigenori Ueda, Igor Bartoš, Ivan Gordeev, Jana Houdkova, Peter Kleinschmidt, Marcus Bär, Petr Jiříček, Thomas Hannappel.
Surface and Interface Analysis 52 [12] 933-938. 2020.

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    Created at: 2020-12-03 15:05:53 +0900Updated at: 2024-03-31 10:44:38 +0900

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