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Hard X‐ray photoelectron spectroscopy study of core level shifts at buried GaP/Si(001) interfaces

Author(s)Oleksandr Romanyuk, Oliver Supplie, Agnieszka Paszuk, Jan Philipp Stoeckmann, Regan George Wilks, Jakob Bombsch, Claudia Hartmann, Raul Garcia‐Diez, Shigenori Ueda, Igor Bartoš, Ivan Gordeev, Jana Houdkova, Peter Kleinschmidt, Marcus Bär, Petr Jiříček, Thomas Hannappel.
Journal titleSurface and Interface Analysis 52 [12] 933-938
ISSN: 01422421
ESI category: PHYSICS
PublisherWiley
Year of publication2020
LanguageEnglish
DOIhttps://doi.org/10.1002/sia.6829
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