HOME > Article > DetailScanning tunneling spectroscopy study of 20 nm-thick nitrogen-doped lanthanum hexaboride thin filmKatsumi Nagaoka, Wataru Hayami, Shun-ichiro Ohmi. Vacuum 170 108973. 2019.https://doi.org/10.1016/j.vacuum.2019.108973 NIMS author(s)NAGAOKA, KatsumiHAYAMI, WataruFulltext and dataset(s) on Materials Data Repository (MDR)Created at: 2019-12-02 10:38:44 +0900Updated at: 2024-04-02 01:25:21 +0900
