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AuthorChuan Liu, Yong Xu, Yun Li, William Scheideler, Takeo Minari.
TitleCritical Impact of Gate Dielectric Interfaces on the Contact Resistance of High-Performance Organic Field-Effect Transistors
Journal titleThe Journal of Physical Chemistry C 117 [23] 12337-12345
ISSN: 19327455 19327447
Year of publication2013
LanguageEnglish
ESI categoryPHYSICS
DOIhttps://doi.org/10.1021/jp4023844
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