Critical Impact of Gate Dielectric Interfaces on the Contact Resistance of High-Performance Organic Field-Effect Transistors
(有機トランジスタのコンタクト抵抗におけるゲート絶縁層の影響)
NIMS author(s)
Fulltext and dataset(s) on Materials Data Repository (MDR)
Created at: 2016-05-24 17:06:18 +0900Updated at: 2024-04-02 03:36:02 +0900