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Reaction and Stability of Metal/Silicide Interface.
(金属/シリサイド界面の反応と安定性.)

J.P.Sullivan, Toshiyuki Hirano, T.Kameda, J.H.Weaver, J. P. Sullivan, T. Komeda, H. M. Meyer, B. M. Trafas, G. D. Waddill, J. H. Weaver.
Applied Physics Letters 56 [7] 671-673. 1990.

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