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Accelerating two-dimensional X-ray diffraction measurement and analysis with density-based clustering for thin films

Author(s)Akihiro Yamashita, Takahiro Nagata, Shinjiro Yagyu, Toru Asahi, Toyohiro Chikyow.
Journal titleJapanese Journal of Applied Physics 60 [SC] SCCG04
ISSN: 13474065, 00214922
ESI category: PHYSICS
PublisherIOP Publishing
Year of publication2021
LanguageEnglish
DOIhttps://doi.org/10.35848/1347-4065/abf2d8
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