SAMURAI - NIMS Researchers Database

HOME > Article > Detail

Modification and Characterization of Interfacial Bonding for Thermal Management of Ruthenium Interconnects in Next-Generation Very-Large-Scale Integration Circuits

Author(s)Tianzhuo Zhan, Keita Sahara, Haruki Takeuchi, Ryo Yokogawa, Kaito Oda, Zhicheng Jin, Shikang Deng, Motohiro Tomita, Yen-Ju Wu, Yibin Xu, Takeo Matsuki, Haidong Wang, Mengjie Song, Sujun Guan, Atsushi Ogura, Takanobu Watanabe.
Journal titleACS Applied Materials & Interfaces 14 [5] 7392-7404
ISSN: 19448252, 19448244
ESI category: MATERIALS SCIENCE
PublisherAmerican Chemical Society (ACS)
Year of publication2022
LanguageEnglish
DOIhttps://doi.org/10.1021/acsami.1c20366
Import this reference to MendeleyMendeley

▲ Go to the top of this page