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Surface potential imaging and characterizations of a GaN p-n junction with Kelvin probe force microscopy

Tomonori Nakamura, Nobuyuki Ishida, Keisuke Sagisaka, Yasuo Koide.
AIP Advances 10 [8] 085010. 2020.
https://doi.org/10.1063/5.0007524
Open Access AIP Publishing (Publisher)

NIMS author(s)

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