Characterization of p-n junctions in wide-gap semiconductors using a cathodoluminescence/electron-beam-induced current technique
| Author(s) | SEKIGUCHI, Takashi, Yuan, Xiaoli, KOIZUMI, Satoshi, TANIGUCHI, Takashi. |
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| Journal title | Beam Injection Based Nanocharacterization of Advanced Materials 139-152 |
| Publisher | Beam Injection Based Nanocharacterization of Advanced Materials |
| Year of publication | 2008 |
| Language | English |