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Impact of Cation Surface Termination on the Electrical Characteristics of HfO2/InGaAs(100) MOS Capacitors

Akihiro Ohtake, Noriyuki Miyata, Yuji Urabe, Tetsuji Yasuda.
Japanese Journal of Applied Physics 50 [10] 10PD01. 2011.
https://doi.org/10.1143/jjap.50.10pd01

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