HOME > Article > DetailMicrostructure and shape memory behaviour of annealed Ti51.5Ni(48.5-X)CuX (X=6.5-20.9) thin films(Ti51.5Ni(48.5-X)CuX (X=6.5-20.9) 薄膜の微細組織と形状記憶挙動)A. Ishida, M. Sato. Philosophical Magazine 87 [35] 5523-5538. 2007.https://doi.org/10.1080/14786430701654394 NIMS author(s)ISHIDA, AkiraFulltext and dataset(s) on Materials Data Repository (MDR)Created at :2016-05-24 15:14:35 +0900 Updated at :2020-11-16 22:58:51 +0900